Unfortunately this page does not have a mobile or narrow screen view. Please switch to a desktop computer or increase the size of your browser. For tablets try flipping the screen.
Laboratory Equipment
EM Centre
Microscopy and tomography
Spectra 300 (STEM)
30-300 kV (S)TEM. Double aberration corrected microscope with a variable acceleration voltage (30, 80, 200 and 300 kV), enabling high-resolution imaging up to 50 pm both in TEM and STEM imaging mode. Equipped with EDX spectrometry for chemical mapping, and ultra-high-resolution electron energy loss spectrometry (UHR-EELS) enabled by its double monochromator and Gatan Continuum filter. It also has a direct-direction Gatan K3 IS camera allowing imaging of soft and beam-sensitive materials.
Category
Permanent
Group
Transmission Electron Microscope (TEM)
Type
Electron Microscopy
Xradia 610 Versa (μ-CT)
High-resolution X-ray tomography microscope system equipped with a 160kV high-energy, high-power microfocus X-ray source, several high-contrast detectors and a large flat panel detector as well as in situ experimental capabilities.
Category
Permanent
Group
X-ray CT (Computed Tomography)
Type
X-Ray Tomography
JXA-8530F Hyperprobe (EPMA)
Field Emission Electron probe microanalyser, equipped with 5 WDS spectrometers, SDD ED system, CL system (panchromatic imaging and xCLent hyperspectral CL).
Category
Permanent
Group
Electron Probe Micro Analyzer (EPMA)
Type
Electron Probe Micro Analyzer
Helios Nanolab G3 (FIB-SEM)
FIB-SEM with Cryostage. Nordlys EBSD, Oxford xxx EDS, Gatan CL.
Category
Permanent
Group
Focused Ion Beam - Scanning Electron Microscope (FIB-SEM)
Type
Electron Microscopy
Talos F200X (STEM)
200 kV (S)TEM. High-brightness X-FEG electron gun, high-resolution imaging up tot 1.1 Å, electron diffraction, electron tomography, and high-sensitivity 2D EDX chemical mapping (Super-X).
Category
Permanent
Group
Transmission Electron Microscope (TEM)
Type
Electron Microscopy
EVO 15 (SEM)
Environmental SEM with Peltier cooling stage, 2x Bruker EDS and automated mineralogy.
Category
Permanent
Group
Scanning Electron Microscope (SEM)
Type
Electron Microscopy
Addons
Type
Detector
Group
EDS detector (Energy Dispersive X-ray Spectroscopy)
Description
Bruker XFlash 6-60
Neoscope II JCM-6000 table-top
JEOL Neoscope II JCM-6000 table-top SEM with EDS
Category
Permanent
Group
Scanning Electron Microscope (SEM)
Type
Electron Microscopy
MultiMode 3
no description found
Category
Permanent
Group
Atomic Force Microscope (AFM)
Type
Atomic Force Microscopy
Gemini 450 (SEM)
High-end SEM with low vacuum capabilities. Symmetry EBSD detector, Oxford xxx EDS, Delmic CL, Quorum Cryostage.
Category
Permanent
Group
Scanning Electron Microscope (SEM)
Type
Electron Microscopy