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Metadata Files

Data Publication

Data used in "Deep-Learning-Enhanced Electron Microscopy for Earth Material Characterization"

Hans van Melick

Utrecht University

(2024)

Descriptions

Understanding the distribution and characteristics of microstructures is crucial for the stability and effectiveness of subsurface activities. However, achieving statistical representativeness typically demands imaging a large number of samples at high magnification. To address this, we developed a workflow to expedite the imaging process. This method was developed, tested, and benchmarked using microstructural data from Back-Scattered Electron (BSE) maps of Berea sandstone, gabbro, serpentinite, and greenschist samples. BSE maps were captured at pixel resolutions of 50 nm (high resolution, HR) and 200 nm (low resolution, LR), with HR maps embedded within the LR maps. Additionally, for the greenschist sample, an extra map was scanned at 800 nm/pixel. Using an image registration algorithm, LR (64x64 pixels) and HR (256x256 pixels) image pairs were created for training Deep Learning (DL) models. This publication includes the following data: full-size and downscaled LR and HR BSE maps, paired LR and HR tiles for overlapping LR/HR data, model-generated data, and metrics of model performance. The image registration algorithm, DL methods, data processing steps, and dataset description are detailed in the research paper "Deep-Learning-Enhanced Electron Microscopy for Earth Material Characterization." For more detailed information about the structure and files in this data publication, refer to the included additional explanation file.

Keywords


Originally assigned keywords
Analytical and microscopy data
Berea Sandstone
Gabbro
Serpentinite
Greenschist
Scanning Electron Microscope (SEM)
Backscatter Electron (BSE)
Electron Microscopy
sandstone
schist
gabbro
serpentinite
Scanning Electrone Microscope
Composition

Corresponding MSL vocabulary keywords
Berea sandstone
gabbro
serpentinite
greenschist
scanning electron microscope (SEM)
electron microscopy
sandstone
schist

MSL enriched keywords
sedimentary rock
sandstone
wacke
Berea sandstone
igneous rock - intrusive
basic intrusive
gabbro
metamorphic rock
serpentinite
schist
greenschist
Apparatus
electron microscopy
scanning electron microscope (SEM)

MSL enriched sub domains i

microscopy and tomography

Source

https://public.yoda.uu.nl/geo/UU01/GHPUMU.html

Source publisher

Utrecht University


DOI

10.24416/uu01-ghpumu


Creators

Hans van Melick

Utrecht University

ORCID:

0009-0009-1950-5360


Citation

van Melick, H. (2024). Data used in "Deep-Learning-Enhanced Electron Microscopy for Earth Material Characterization" (Version 1.0) [Data set]. Utrecht University. https://doi.org/10.24416/UU01-GHPUMU


Dates

Updated:

2024-09-16T10:07:10

Collected:

2022-09-01/2023-12-31


Language

en


Rights

Open - freely retrievable

Creative Commons Attribution 4.0 International Public License


Datacite version

Version 1.0